Identification of process/design issues during 0.18 µm technology qualification for space application. - Julie Ferrigno; Philippe Perdu; Kevin Sanchez; Dean Lewis (DATE, 2007)

When AES blinks: introducing optical side channel. - Julie Ferrigno; Martin Hlavác (IET Inf. Secur., 2008)

Generic simulator for faulty IC. - Julie Ferrigno; Aziz Machouat; Philippe Perdu; Dean Lewis; Gérald Haller; Vincent Goubier (Microelectron. Reliab., 2008)