Designing and Implementing Efficient BISR Techniques for Embedded RAMs. - Michael Nicolaidis; Slimane Boutobza; Nadir Achouri; R. D. Shawn Blanton; Julie Segal; David Y. Lepejian; Ben Chu; Tony Singh; Harvey Berman (LATW, 2001)

Using Electrical Bitmap Results from Embedded Memory to Enhance Yield. - Julie Segal; Alvin Jee; David Y. Lepejian; Ben Chu (IEEE Des. Test Comput., 2001)

Test as a Key Enabler for Faster Yield Ramp-Up. - Julie Segal; Rene Segers; Rob Aitken; S. Eichenberge; A. Gattike; M. Millegen; R. Seger; S. Venkataraman (VTS, 2002)