Fitting ATE Channels with Scan Chains: a Comparison between a Test Data Compression Technique and Serial Loading of Scan Chains. - Julien Dalmasso; Marie-Lise Flottes; Bruno Rouzeyre (DELTA, 2006)

Test data compression and TAM design. - Julien Dalmasso; Marie-Lise Flottes; Bruno Rouzeyre (VLSI-SoC, 2007)

Compression-based SoC Test Infrastructures. - Julien Dalmasso; Marie-Lise Flottes; Bruno Rouzeyre (VLSI-SoC (Selected Papers), 2007)

Improving the Test of NoC-Based SoCs with Help of Compression Schemes. - Julien Dalmasso; Érika F. Cota; Marie-Lise Flottes; Bruno Rouzeyre (ISVLSI, 2008)