Benefits of field failure distribution modeling to the failure analysis. - Corinne Bergès; Julien Goxe (Microelectron. Reliab., 2013)

Detectability of automotive power MOSFET on-resistance failure at high current induced by Wafer Fab process excursion. - Yann Weber; Julien Goxe; M. Castignolles (Microelectron. Reliab., 2013)

Failure analysis on recovering low resistive via in mixed-mode device. - M. Castignolles; Julien Goxe; R. Martin (Microelectron. Reliab., 2015)

Latent gate oxide defects case studies. - Julien Goxe; C. Abouda; Béatrice Vanhuffel (Microelectron. Reliab., 2015)