Built-in aging monitoring for safety-critical applications. - Julio César Vázquez; Víctor H. Champac; Adriel Ziesemer; Ricardo Reis 001; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (IOLTS, 2009)

Stuck-Open Fault Leakage and Testing in Nanometer Technologies. - Julio César Vázquez; Víctor H. Champac; Chuck Hawkins; Jaume Segura 001 (VTS, 2009)

Programmable aging sensor for automotive safety-critical applications. - Julio César Vázquez; Víctor H. Champac; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (DATE, 2010)

Predictive error detection by on-line aging monitoring. - Julio César Vázquez; Víctor H. Champac; Adriel Ziesemer; Ricardo Reis 001; Jorge Semião; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (IOLTS, 2010)

Low-sensitivity to process variations aging sensor for automotive safety-critical applications. - Julio César Vázquez; Víctor H. Champac; Adriel Ziesemer; Ricardo Reis 001; Isabel Maria Cacho Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (VTS, 2010)

Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors. - Celestino V. Martins; Jorge Semião; Julio César Vázquez; Víctor H. Champac; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (VTS, 2011)

Aging-Aware Power or Frequency Tuning With Predictive Fault Detection. - Jackson Pachito; Celestino V. Martins; Bruno Jacinto; Jorge Semião; Julio César Vázquez; Víctor H. Champac; Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001 (IEEE Des. Test Comput., 2012)

Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion. - Julio César Vázquez; Víctor H. Champac; Jorge Semião; Isabel C. Teixeira; Marcelino B. Santos; João Paulo Teixeira 001 (J. Electron. Test., 2013)