Testing of Stuck-Open Faults in Nanometer Technologies. - Víctor H. Champac; Julio Vazquez Hernandez; Salvador Barceló; Roberto Gómez 001; Chuck Hawkins; Jaume Segura 001 (IEEE Des. Test Comput., 2012)

Error prediction and detection methodologies for reliable circuit operation under NBTI. - Julio Vazquez Hernandez (ITC, 2014)