Punch-Through-Stopper Free Nanosheet FETs With Crescent Inner-Spacer and Isolated Source/Drain. - Jun-Sik Yoon; Jinsu Jeong; Seunghwan Lee; Rock-Hyun Baek (IEEE Access, 2019)

Bottom Oxide Bulk FinFETs Without Punch-Through-Stopper for Extending Toward 5-nm Node. - Jun-Sik Yoon; Jinsu Jeong; Seunghwan Lee; Rock-Hyun Baek (IEEE Access, 2019)

Source/Drain Patterning FinFETs as Solution for Physical Area Scaling Toward 5-nm Node. - Jun-Sik Yoon; Seunghwan Lee; Junjong Lee; Jinsu Jeong; Hyeok Yun; Bohyeon Kang; Rock-Hyun Baek (IEEE Access, 2019)

Neural Approach for Modeling and Optimizing Si-MOSFET Manufacturing. - Hyun-Chul Choi; Hyeok Yun; Jun-Sik Yoon; Rock-Hyun Baek (IEEE Access, 2020)

Comprehensive Analysis of Source and Drain Recess Depth Variations on Silicon Nanosheet FETs for Sub 5-nm Node SoC Application. - Jinsu Jeong; Jun-Sik Yoon; Seunghwan Lee; Rock-Hyun Baek (IEEE Access, 2020)

Device Design Guideline of 5-nm-Node FinFETs and Nanosheet FETs for Analog/RF Applications. - Jun-Sik Yoon; Rock-Hyun Baek (IEEE Access, 2020)

A Novel Sub-5-nm Node Dual-Workfunction Folded Cascode Nanosheet FETs for Low Power Mobile Applications. - Jun-Sik Yoon; Rock-Hyun Baek (IEEE Access, 2020)

Analysis of TSV-Induced Mechanical Stress and Electrical Noise Coupling in Sub 5-nm Node Nanosheet FETs for Heterogeneous 3D-ICs. - Jinsu Jeong; Jun-Sik Yoon; Rock-Hyun Baek (IEEE Access, 2021)

Monolithic 3D 6T-SRAM Based on Newly Designed Gate and Source/Drain Bottom Contact Schemes. - Junjong Lee; Jun-Sik Yoon; Jinsu Jeong; Seunghwan Lee; Sanguk Lee; Rock-Hyun Baek (IEEE Access, 2021)

Digital/Analog Performance Optimization of Vertical Nanowire FETs Using Machine Learning. - Jun-Sik Yoon; Seunghwan Lee; Hyeok Yun; Rock-Hyun Baek (IEEE Access, 2021)

Extraction of Device Structural Parameters Through DC/AC Performance Using an MLP Neural Network Algorithm. - Hyundong Jang; Hyeok Yun; Chanyang Park; Kyeongrae Cho; Kihoon Nam; Jun-Sik Yoon; Hyun-Chul Choi; Rock-Hyun Baek (IEEE Access, 2022)

DC Performance Variations by Grain Boundary in Source/Drain Epitaxy of Sub-3-nm Nanosheet Field-Effect Transistors. - Jun-Sik Yoon; Jinsu Jeong; Seunghwan Lee; Junjong Lee; Sanguk Lee; Jaewan Lim; Rock-Hyun Baek (IEEE Access, 2022)

A Comparative Study on Front-Side, Buried and Back-Side Power Rail Topologies in 3nm Technology Node. - Sandra Maria Shaji; Lingjun Zhu; Jun-Sik Yoon; Sung Kyu Lim (ISLPED, 2023)

Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning. - Kihoon Nam; Chanyang Park; Hyeok Yun; Jun-Sik Yoon; Hyundong Jang; Kyeongrae Cho; Min Sang Park; Hyun-Chul Choi; Rock-Hyun Baek (IEEE Access, 2023)

Placement-Aware 3D Net-to-Pad Assignment for Array-Style Hybrid Bonding 3D ICs. - Pruek Vanna-Iampikul; Jun-Sik Yoon; Chaeryung Park; Gary Yeap; Sung Kyu Lim (ISPD, 2025)