Experimental evaluation of a parallel blind demodulator combined with a Reed-Solomon decoder in the presence of intersymbol interference. - Kazuo Tanada; Hiroshi Kubo; Akihiro Okazaki; Takeshi Uraguchi; Shuichi Hayashi; Hisashi Ishikawa; Atsushi Iwase; Jun Taniguchi (VTC Fall, 2001)

Etching characteristics of a silicon surface induced by focused ion beam irradiation. - Noritaka Kawasegi; Noboru Morita; Shigeru Yamada; Noboru Takano; Tatsuo Oyama; Kiwamu Ashida; Jun Taniguchi; Iwao Miyamoto; Sadao Momota (Int. J. Manuf. Technol. Manag., 2006)

Fabrication of Less than 20-nm-Diameter Nanodot Arrays Using Inorganic Electron Beam Resist and Post Exposure Bake. - Jun Taniguchi; Tetsuro Manabe; Kiyoshi Ishikawa (Int. J. Autom. Technol., 2011)

Improvement of Transfer Durability of a Pillar-Shaped Release-Agent-Free Replica Mold in Ultraviolet Nanoimprint Lithography. - Junpei Tsuchiya; Gen Nakagawa; Shin Hiwasa; Jun Taniguchi (Int. J. Autom. Technol., 2018)

Fabrication of Rose Petal Surface Using Release-Coated UV-Curable Resin via Ultraviolet Nanoimprint Lithography. - Takuto Wakasa; Kazuki Fujiwara; Jun Taniguchi (Int. J. Autom. Technol., 2024)