Defect detection of flip-chip solder joints using modal analysis. - Junchao Liu; Tielin Shi; Ke Wang; Zirong Tang; Guanglan Liao (Microelectron. Reliab., 2012)

Distilling Semantic Priors from SAM to Efficient Image Restoration Models. - Quan Zhang; Xiaoyu Liu; Wei Li 002; Hanting Chen; Junchao Liu; Jie Hu 021; Zhiwei Xiong; Chun Yuan; Yunhe Wang 001 (CVPR, 2024)

Collaboration of Teachers for Semi-supervised Object Detection. - Liyu Chen; Huaao Tang; Yi Wen; Hanting Chen; Wei Li 002; Junchao Liu; Jie Hu 021 (CoRR, 2024)