RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test. - Jung-Been Im; Sunghoon Chun; Geunbae Kim; Jin-Ho Ahn; Sungho Kang 001 (Asian Test Symposium, 2004)

MICRO: a new hybrid test data compression/decompression scheme. - Sunghoon Chun; YongJoon Kim; Jung-Been Im; Sungho Kang 001 (IEEE Trans. Very Large Scale Integr. Syst., 2006)