A Test and Maintenance Controller for a Module Containing Testable Chips. - Melvin A. Breuer; Jung-Cheun Lien (ITC, 1988)

Concurrent Control of Multiple BIT Structures. - Sandeep K. Gupta 001; Melvin A. Breuer; Jung-Cheun Lien (ITC, 1988)

Maximal Diagnosis for Wiring Networks. - Jung-Cheun Lien; Melvin A. Breuer (ITC, 1991)

An optimal scheduling algorithm for testing interconnect using boundary scan. - Jung-Cheun Lien; Melvin A. Breuer (J. Electron. Test., 1991)

Test program synthesis for modules and chips having boundary scan. - Jung-Cheun Lien; Melvin A. Breuer (J. Electron. Test., 1993)