Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors. - Edward Namkyu Cho; Jung Han Kang; Ilgu Yun (Microelectron. Reliab., 2011)

Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress. - Jung Han Kang; Edward Namkyu Cho; Ilgu Yun (Microelectron. Reliab., 2014)