Two-dimensional dopant profiling in semiconductor devices by electron holography and chemical etching delineation techniques with the same specimen. - Ulugbek Shaislamov; Jun-Mo Yang; Jung Ho Yoo; Hyun-Sang Seo; Kyung-Jin Park; Chel-Jong Choi; Tae-Eun Hong; Beelyong Yang (Microelectron. Reliab., 2008)

Fast Software Implementation of AES-CCM on Multiprocessors. - Jung Ho Yoo (ICA3PP (2), 2011)