Influence of supply voltage on the multi-cell upset soft error sensitivity of dual- and triple-well 28 nm CMOS SRAMs. - Balaji Narasimham; Jung K. Wang; Narayana Vedula; Saket Gupta; Brandon Bartz; Carl Monzel; Indranil Chatterjee; Bharat L. Bhuva; Ronald D. Schrimpf; Robert A. Reed (IRPS, 2015)

Evaluation of the system-level SER performance of gigabit ethernet transceiver devices. - Balaji Narasimham; Tim Wu; Jung K. Wang; Bruce Conway (IRPS, 2018)