An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced FinFET Technology. - Sangmin Oh; Taeyoung Jeong; Junghwan Yum; Minhyuk Lim; Yoohwan Kim; Bongyong Jeong; Jeongmin Jo; Hyewon Shim; Shin-Young Chung; Paul Jung (IRPS, 2024)