Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit. - Taiki Uemura; Soonyoung Lee; Dahye Min; Ihlhwa Moon; Jungman Lim; Seungbae Lee; Hyun-Chul Sagong; Sangwoo Pae (IRPS, 2018)

Reliability of Industrial grade Embedded-STT-MRAM. - Yongsung Ji; Hyunjae Goo; Jungman Lim; Tae-Young Jeong; Taiki Uemura; Gun Rae Kim; Boil Seo; Seungbae Lee; Goeun Park; Jeongmin Jo; Sang-Il Han; Kilho Lee; et al. (IRPS, 2020)