Corrigendum to "A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors" [Microelectron. Reliab. 60 (2016) 67-69]. - Weiliang Wang; Karim Khan; Xingye Zhang; Haiming Qin; Jun Jiang; Lijing Miao; Kemin Jiang; Pengjun Wang; Mingzhi Dai; Junhao Chu (Microelectron. Reliab., 2016)

A Multidimensional Choledoch Database and Benchmarks for Cholangiocarcinoma Diagnosis. - Qing Zhang; Qingli Li; Guanzhen Yu; Li Sun 012; Mei Zhou; Junhao Chu (IEEE Access, 2019)

A study on ionic gated MoS2 phototransistors. - Binmin Wu; Xudong Wang; Hongwei Tang; Tie Lin; Hong Shen; Weida Hu; Xiangjian Meng; Wenzhong Bao; Jianlu Wang; Junhao Chu (Sci. China Inf. Sci., 2019)

Structure-Property Relationships in Graphene-Based Strain and Pressure Sensors for Potential Artificial Intelligence Applications. - Zewei Luo; Xiaotong Hu; Xiyue Tian; Chen Luo; Hejun Xu; Quanling Li; Qianhao Li; Jian Zhang; Fei Qiao; Xing Wu 005; V. E. Borisenko; Junhao Chu (Sensors, 2019)

Resistive Effects on the Spatially Resolved Absolute Electroluminescence of Thin-Film Cu(In, Ga)Se2 Solar Cells Studied by a Distributed Two-Diode Model. - Xiaobo Hu; Youyang Wang; Yun Jia; Jianyu Hong; Tengfei Chen; Juanjuan Xue; Yuanjing Chen; Jiahua Tao; Guoen Weng; Shaoqiang Chen; Ziqiang Zhu; Junhao Chu (IEEE Access, 2020)

Interface engineering of ferroelectric-gated MoS2 phototransistor. - Shuaiqin Wu; Xudong Wang; Wei Jiang; Luqi Tu; Yan Chen; Jingjing Liu; Tie Lin; Hong Shen; Jun Ge; Weida Hu; Xiangjian Meng; Jianlu Wang; et al. (Sci. China Inf. Sci., 2021)

Associative learning of a three-terminal memristor network for digits recognition. - Yiming Ren; Bobo Tian; Mengge Yan; Guangdi Feng; Bin Gao; Fangyu Yue; Hui Peng; Xiaodong Tang; Qiuxiang Zhu; Junhao Chu; Chungang Duan (Sci. China Inf. Sci., 2023)

Bulk photovoltaic effect in two-dimensional ferroelectric α-In2Se3. - Huiting Wang; Shuaiqin Wu; Yan Chen; Qianru Zhao; Jinhua Zeng; Ruotong Yin; Yuqing Zheng; Chang Liu; Shukui Zhang; Tie Lin; Hong Shen; Xiangjian Meng; et al. (Sci. China Inf. Sci., 2025)