Determination of Interconnect Structural Parameters for Best- and Worst-Case Delays. - Atsushi Kurokawa; Hiroo Masuda; Junko Fujii; Toshinori Inoshita; Akira Kasebe; Zhangcai Huang; Yasuaki Inoue (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2006)