SIDEST: A sample-free framework for crop field boundary delineation by integrating super-resolution image reconstruction and dual edge-corrected Segment Anything model. - Haoran Sun; Zhijian Wei; Weiguo Yu; Gaoxiang Yang; Junnan She; Hengbiao Zheng; Chongya Jiang; Xia Yao; Yan Zhu 005; Weixing Cao; Tao Cheng 003; Iftikhar Ali (Comput. Electron. Agric., 2025)