Hot Carrier Injection Induced Degradation of 14 nm FinFET under High Source-Drain Voltage Bias. - Junru Qu; Jiabao Ye; Zhangbin Yang; Daixiao Peng; Xi Cai; Xueguang Lian; Yong Ding; Bing Chen (ICTA, 2024)

Investigation of Read Disturb for Hf0.5Zr0.502 Ferroelectric Field-Effect Transistors Based Neuromorphic Applications. - Xinze Li; Yiqin Zeng; Yuxuan Wu; Ying Sun; Junru Qu; Chengji Jin; Jiani Gu; Rongzong Shen; Gaobo Lin; Dawei Gao; Xiao Yu; Bing Chen; et al. (IRPS, 2024)

Low Temperature Characterization and Modeling of Hot Carrier Injection in 14 nm Si FinFET. - Junru Qu; Dong Liu; Bing Chen; Ying Sun; Xinze Li; Chengji Jin; Jiajia Chen; Haoji Qian; Rongzong Shen; Xiao Yu; Dawei Gao; Ran Cheng; et al. (IRPS, 2024)