Comprehensive separate extraction of parasitic resistances in MOSFETs considering the gate bias-dependence and the asymmetric overlap length. - Junyeap Kim; Hanbin Yoo; Heesung Lee; Seong Kwang Kim; Sungju Choi; Sung-Jin Choi; Dae Hwan Kim; Dong Myong Kim (Microelectron. Reliab., 2018)