On a Logical Fault Model H1SGLF for Enhancing Defect Coverage. - Junzhi Sang; Tsuyoshi Shinogi; Haruhiko Takase; Terumine Hayashi (Asian Test Symposium, 1998)

An enhanced fault model for high defect coverage. - Junzhi Sang; Tsuyoshi Shinogi; Haruhiko Takase; Hidehiko Kita; Terumine Hayashi (Syst. Comput. Jpn., 2001)