Experimental Analog Circuit for Parametric Test Methods Efficiency Evaluation. - Juraj Brenkus; Viera Stopjaková; Jozef Mihálov (DDECS, 2008)

Comparison of different test strategies on a mixed-signal circuit. - Juraj Brenkus; Viera Stopjaková; Ronny Vanhooren; Anton Chichkov (DDECS, 2009)

Increasing the efficiency of analog OBIST using on-chip compensation of technology variations. - Daniel Arbet; Juraj Brenkus; Gábor Gyepes; Viera Stopjaková (DDECS, 2011)

Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies. - Gábor Gyepes; Juraj Brenkus; Daniel Arbet; Viera Stopjaková (DDECS, 2011)

OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters. - Daniel Arbet; Gábor Gyepes; Juraj Brenkus; Viera Stopjaková (DDECS, 2012)

Application of IDDT test towards increasing SRAM reliability in nanometer technologies. - Gábor Gyepes; Daniel Arbet; Juraj Brenkus; Viera Stopjaková (DDECS, 2012)

Numerical method for DC fault analysis simplification and simulation time reduction. - Juraj Brenkus; Viera Stopjaková; Gábor Gyepes (DDECS, 2013)

A novel impedance calculation method and its time efficiency evaluation. - Juraj Brenkus; Viera Stopjaková; Daniel Arbet; Gábor Gyepes; Libor Majer (DDECS, 2014)

Current Sensing Completion Detection in Single-Rail Asynchronous Systems. - Lukás Nagy; Viera Stopjaková; Juraj Brenkus (Comput. Informatics, 2014)

A new IDDT test approach and its efficiency in covering resistive opens in SRAM arrays. - Gábor Gyepes; Viera Stopjaková; Daniel Arbet; Libor Majer; Juraj Brenkus (Microprocess. Microsystems, 2014)

BIST architecture for oscillation test of analog ICs and investigation of test hardware influence. - Daniel Arbet; Viera Stopjaková; Juraj Brenkus; Gábor Gyepes; Martin Kovác; Libor Majer (Microelectron. Reliab., 2014)

Low-voltage bulk-driven variable gain amplifier in 130 nm CMOS technology. - Daniel Arbet; Martin Kovác; Lukás Nagy; Viera Stopjaková; Juraj Brenkus (DDECS, 2016)

Impedance calculation based method for AC fault analysis of mixed-signal circuits. - Juraj Brenkus; Viera Stopjaková; Lukás Nagy; Daniel Arbet (DDECS, 2016)

A Novel Method Towards Time-Efficient Fault Analysis of Analog and Mixed-Signal Circuits. - Juraj Brenkus; Viera Stopjaková; Viera Cernanová; Daniel Arbet; Lukás Nagy; Vladimír Sedlák (J. Circuits Syst. Comput., 2017)

High side power MOSFET switch driver for a low-power AC/DC converter. - Miroslav Potocný; Juraj Brenkus; Viera Stopjaková (DDECS, 2019)