On the Efficiency of the Transition Fault Model for Delay Faults. - Manfred Geilert; Jürgen Alt; Michael Zimmermann (ICCAD, 1990)

Test generation for IDDQ testing and leakage fault detection in CMOS circuits. - Udo Mahlstedt; Matthias Heinitz; Jürgen Alt (EURO-DAC, 1992)

Simulation of non-classical Faults on the Gate Level - The Fault Simulator COMISM -. - Udo Mahlstedt; Jürgen Alt (ITC, 1993)

Simulation of non-classical faults on the gate level-fault modeling. - Jürgen Alt; Udo Mahlstedt (VTS, 1993)

Deterministic test generation for non-classical faults on the gate level. - Udo Mahlstedt; Jürgen Alt; Ingo Hollenbeck (Asian Test Symposium, 1995)

CURRENT: a test generation system for IDDQ testing. - Udo Mahlstedt; Jürgen Alt; Matthias Heinitz (VTS, 1995)

Fehlersimulation synchroner Schaltungen unter Berücksichtigung nicht-klassischer Fehler. - Jürgen Alt (1995)

Future of EDA: Usual suspect or silent hero for successful semiconductor business? - Jürgen Alt (DDECS, 2011)