Schnelle Rasterkraftmikroskopie durch moderne Regelungstechnik und mechatronische Systemintegration. - Jürgen Steininger; Stefan Kuiper; Shingo Ito; Georg Schitter (Elektrotech. Informationstechnik, 2012)

Atomic force microscopy using voice coil actuators for vibration isolation. - Shingo Ito; Daniel Neyer; Stefan Pirker; Jürgen Steininger; Georg Schitter (AIM, 2015)

Auto-tuning PI controller for surface tracking in atomic force microscopy - a practical approach. - Dominik Kohl; Thomas Riel; Rudolf Saathof; Jürgen Steininger; Georg Schitter (ACC, 2016)