Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs. - Cora Salm; André J. Hof; Fred G. Kuper; Jurriaan Schmitz (Microelectron. Reliab., 2006)

Low-frequency noise in hot-carrier degraded nMOSFETs. - Cora Salm; Eric Hoekstra; Jay S. Kolhatkar; André J. Hof; Hans Wallinga; Jurriaan Schmitz (Microelectron. Reliab., 2007)

Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip. - Cora Salm; Victor M. Blanco Carballo; Joost Melai; Jurriaan Schmitz (Microelectron. Reliab., 2008)

RF CMOS reliability simulations. - Guido T. Sasse; Mustafa Acar; Fred G. Kuper; Jurriaan Schmitz (Microelectron. Reliab., 2008)

Micro- and nano-link ultra-low power heaters for sensors. - Alfons W. Groenland; Elizaveta Vereshchagina; Alexey Y. Kovalgin; Rob A. M. Wolters; J. G. E. Gardeniers; Jurriaan Schmitz (ESSDERC, 2012)

Role of junction depth in light emission from silicon p-i-n leds. - Giulia Piccolo; Amir Sammak; Raymond J. E. Hueting; Jurriaan Schmitz; Lis K. Nanver (ESSDERC, 2013)

Identifying failure mechanisms in LDMOS transistors by analytical stability analysis. - Alessandro Ferrara; Peter G. Steeneken; Boni K. Boksteen; Anco Heringa; Andries J. Scholten; Jurriaan Schmitz; Raymond J. E. Hueting (ESSDERC, 2014)

Silicon LEDs in FinFET technology. - Giulia Piccolo; Piet I. Kuindersma; Lars-Åke Ragnarsson; Raymond J. E. Hueting; Nadine Collaert; Jurriaan Schmitz (ESSDERC, 2014)

Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs. - Maurits J. de Jong; Cora Salm; Jurriaan Schmitz (Microelectron. Reliab., 2017)

Towards understanding recovery of hot-carrier induced degradation. - Maurits J. de Jong; Cora Salm; Jurriaan Schmitz (Microelectron. Reliab., 2018)

Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices. - Maurits J. de Jong; Cora Salm; Jurriaan Schmitz (IRPS, 2020)

Characterisation of Photodiodes in 22 nm FDSOI at 850 nm. - Jelle H. T. Bakker; Mark S. Oude Alink; Jurriaan Schmitz; Bram Nauta (ESSDERC, 2023)