Temporal versus Spatial Observability in Model-Based Diagnosis. - Jurryt Pietersma; Arjan J. C. van Gemund (SMC, 2006)

Automated Fault Diagnosis in Embedded Systems. - Peter Zoeteweij; Jurryt Pietersma; Rui Abreu 001; Alexander Feldman; Arjan J. C. van Gemund (SSIRI, 2008)