The open shop interactive mask design operation at harris semiconductor. - Justin E. Harlow III (DAC, 1977)

Synthesis of Wiring Signature-Invariant Equivalence Class Circuit Mutants and Applications to Benchmarking. - Debabrata Ghosh; Nevin Kapur; Franc Brglez; Justin E. Harlow III (DATE, 1998)

Design of Experiments for Evaluation of BDD Packages Using Controlled Circuit Mutations. - Justin E. Harlow III; Franc Brglez (FMCAD, 1998)

Design of experiments in BDD variable ordering: lessons learned. - Justin E. Harlow III; Franc Brglez (ICCAD, 1998)

Mirror, mirror, on the wall...is the new release any different at all? [BDDs]. - Justin E. Harlow III; Franc Brglez (ISCAS (6), 1999)

Guest Editors' Introduction: Benchmarking for Design and Test. - Scott Davidson 001; Justin E. Harlow III (IEEE Des. Test Comput., 2000)

Overview of Popular Benchmark Sets. - Justin E. Harlow III (IEEE Des. Test Comput., 2000)

Design of experiments and evaluation of BDD ordering heuristics. - Justin E. Harlow III; Franc Brglez (Int. J. Softw. Tools Technol. Transf., 2001)

Toward Design Technology in 2020: Trends, Issues, and Challenges. - Justin E. Harlow III (ISVLSI, 2003)

A novel approach for variation aware power minimization during gate sizing. - Venkataraman Mahalingam; N. Ranganathan; Justin E. Harlow III (ISLPED, 2006)

Architectures for Silicon Nanoelectronics and Beyond. - R. Iris Bahar; Dan W. Hammerstrom; Justin E. Harlow III; William H. Joyner Jr.; Clifford Lau; Diana Marculescu; Alex Orailoglu; Massoud Pedram (Computer, 2007)