Identifying electrical mechanisms responsible for functional failures during harsh external ESD and EMC aggression. - P. Besse; K. Abouda; C. Abouda (Microelectron. Reliab., 2011)

Near-field injection on a Safe System Basis Chip at silicon level. - Bertrand Vrignon; A. Doridant; K. Abouda; Y. Gao; D. Pagnoux; T. Marek (EMC Compo, 2015)