An SIMD machine for low-level vision. - K. Banerjee; P. S. Sastry 001; K. R. Ramakrishnan; Y. V. Venkatesh (Inf. Sci., 1988)

Determination of EOQ of Multi-Item inventory Problems through nonlinear Goal Programming with penalty Function. - Shibaji Panda; K. Banerjee; Manjusri Basu (Asia Pac. J. Oper. Res., 2005)

First demonstration of ferroelectric Si: HfO2 based 3D FE-FET with trench architecture for dense nonvolatile memory application. - K. Banerjee; Laurent Breuil; A. P. Milenin; M. Pak; J. Stiers; Sean R. C. McMitchell; L. Di Piazza; Geert Van den Bosch; Jan Van Houdt (IMW, 2021)

Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control. - S. Subhechha; Nouredine Rassoul; Attilio Belmonte; Hubert Hody; Harold Dekkers; Michiel J. van Setten; Adrian Vaisman Chasin; Shamin H. Sharifi; K. Banerjee; H. Puliyalil; Shreya Kundu; M. Pak; et al. (ICICDT, 2022)

High-K incorporated in a SiON tunnel layer for 3D NAND programming voltage reduction. - Laurent Breuil; L. Nyns; S. Rachidi; K. Banerjee; Antonio Arreghini; J. P. Bastos; S. Ramesh; Geert Van den Bosch; Maarten Rosmeulen (IMW, 2022)

At the Extreme of 3D-NAND Scaling: 25 nm Z-Pitch with 10 nm Word Line Cells. - S. Rachidi; Antonio Arreghini; Devin Verreck; G. L. Donadio; K. Banerjee; K. Katcko; Yusuke Oniki; Geert Van den Bosch; Maarten Rosmeulen (IMW, 2022)

A comprehensive variability study of doped HfO2 FeFET for memory applications. - Nicolo Ronchi; Lars-Åke Ragnarsson; Umberto Celano; Ben Kaczer; K. Kaczmarek; K. Banerjee; Sean R. C. McMitchell; Geert Van den Bosch; Jan Van Houdt (IMW, 2022)

Towards low damage and fab-compatible top-contacts in MX2 transistors using a combined synchronous pulse atomic layer etch and wet-chemical etch approach. - Shreya Kundu; D. H. van Doip; Tom Schram; Quentin Smets; S. Banerjee; Benjamin Groven; Daire Cott; Stefan Decoster; P. Bezard; F. Lazzarino; K. Banerjee; Souvik Ghosh 001; et al. (VLSI Technology and Circuits, 2023)