MIMC reliability and electrical behavior defined by a physical layer property of the dielectric. - Jan Ackaert; R. Charavel; K. Dhondt; B. Vlachakis; Luc De Schepper; M. Millecam; E. Vandevelde; P. Bogaert; A. Iline; Eddy De Backer; Alexandru Vlad; Jean-Pierre Raskin (Microelectron. Reliab., 2008)