Reproducibility of transmission line measurement of bipolar I-V characteristics of MOSFETs. - T. P. Chen; R. Chan; S. Fung; K. F. Lo (IEEE Trans. Instrum. Meas., 1999)

Statistical aspects of the degradation of LDD nMOSFETs. - E. Andries; R. Dreesen; Kris Croes; Ward De Ceuninck; Luc De Schepper; Guido Groeseneken; K. F. Lo; Marc D'Olieslaeger; Jan D'Haen (Microelectron. Reliab., 2002)

PubMed-supported clinical term weighting approach for improving inter-patient similarity measure in diagnosis prediction. - Lawrence Wing-Chi Chan; Ying Liu 004; Tao Chan; Helen K. W. Law; S. C. Cesar Wong; Andy Yeung; K. F. Lo; S. W. Yeung; K. Y. Kwok; William Chan; Thomas Lau; Chi-Ren Shyu (BMC Medical Informatics Decis. Mak., 2015)