Prediction of dielectric reliability from I-V characteristics: Poole-Frenkel conduction mechanism leading to sqrt(E) model for silicon nitride MIM capacitor. - K.-H. Allers (Microelectron. Reliab., 2004)

Dielectric thinning model applied to metal insulator metal capacitors with Al2O3 dielectric. - K.-H. Allers; Josef Böck; S. Boguth; K. Goller; Herbert Knapp; Rudolf Lachner (Microelectron. Reliab., 2009)

Intrinsic and extrinsic reliability of a serial connection of capacitors. - K.-H. Allers (Microelectron. Reliab., 2010)