Use of scanning capacitance microscopy for controlling wafer processing. - O. Jeandupeux; V. Marsico; A. Acovic; P. Fazan; H. Brune; K. Kern (Microelectron. Reliab., 2002)

Reading the footprints of strained islands. - Armando Rastelli; Mathieu Stoffel; G. Katsaros; J. Tersoff; U. Denker; T. Merdzhanova; Gouri Sankar Kar; Giovanni Costantini; K. Kern; H. von Känel (Microelectron. J., 2006)