Testing System for Redundant Memory. - Y. Hayasaka; K. Shimotori; K. Okada (ITC, 1982)

Testing of Sense Amplifier in Dynamic Memory. - T. Tada; T. Kobayashi; K. Okada; Y. Kuramitsu (ITC, 1982)

A digital signal processor module architecture and its implementation using VLSIs. - K. Okada; T. Ehara; H. Suzuki; K. Yanagida; K. Saito; N. Ichiura (ICASSP, 1984)

Modular manufacturing. - Hideo Tsukune; M. Tsukamoto; Toshio Matsushita; Fumiaki Tomita; K. Okada; Tsukasa Ogasawara; Kunikatsu Takase; T. Yuba (J. Intell. Manuf., 1993)

Hot Carrier Degradation and performance boost on Si Channel nFET Gate-All-Around Nanosheet Devices. - H. Zhou; M. Hasanuzzaman; S. D. Suk; S. Emans; S. Siddiqui; R. Robison; R. Vega; M. Wang; Yasir Sulehria; S. Mochizuki; C. Durfee; Oleg Gluschenkov; et al. (IRPS, 2025)