Modelling of nanostructured memristor device characteristics using Artificial Neural Network (ANN). - Tukaram D. Dongale; K. P. Patil; S. R. Vanjare; A. R. Chavan; P. K. Gaikwad; Rajanish K. Kamat (J. Comput. Sci., 2015)

On the Interval Estimation of Stress-Strength Reliability for Exponentiated Scale Family of Distributions. - K. P. Patil; H. V. Kulkarni (Qual. Reliab. Eng. Int., 2017)

LDSAE: LeNet deep stacked autoencoder for secure systems to mitigate the errors of jamming attacks in cognitive radio networks. - Chandrakant Athavale Chhaya; K. P. Patil (Int. J. Netw. Virtual Organisations, 2024)