A Comprehensive Hot Carrier Injection with Voltage Ramp Stress (HCI-VRS) through Different Model Verification for More than Moore Diversity Application. - C. H. Chiang; K. P. Sou; D. S. Huang; J. H. Lee (IRPS, 2024)

HV-CV Analysis Trapping Behavior in 650V pGaN HEMT with Field Plates for High-Voltage Power Applications. - Y. S. Lin; Cheng Hsun Yang; C. H. Wang; K. P. Sou; Cheng Hong Yang; M. C. Shih; W. S. Hung; W. H. Chuang; F. M. Ciou; P. C. Chiu; C. C. Hsu; C. F. Chen; et al. (IRPS, 2024)