Plasma-etching processes for ULSI semiconductor circuits. - Michael Armacost; Peter D. Hoh; Richard Wise; Wendy Yan; Jeffrey J. Brown; John H. Keller; George A. Kaplita; Scott D. Halle; K. Paul Muller; Munir D. Naeem; Senthil Srinivasan; Hung Y. Ng; et al. (IBM J. Res. Dev., 1999)

POWER7TM local clocking and clocked storage elements. - James D. Warnock; Leon J. Sigal; Dieter F. Wendel; K. Paul Muller; Joshua Friedrich; Victor V. Zyuban; Ethan H. Cannon; A. J. KleinOsowski (ISSCC, 2010)

Soft Error Resiliency Characterization on IBM BlueGene/Q Processor. - Chen-Yong Cher; K. Paul Muller; Ruud A. Haring; David L. Satterfield; Thomas E. Musta; Thomas Gooding; Kristan D. Davis; Marc Boris Dombrowa; Gerard V. Kopcsay; Robert M. Senger; Yutaka Sugawara; Krishnan Sugavanam (ASP-DAC, 2014)

Soft error resiliency characterization and improvement on IBM BlueGene/Q processor using accelerated proton irradiation. - Chen-Yong Cher; K. Paul Muller; Ruud A. Haring; David L. Satterfield; Thomas E. Musta; Thomas Gooding; Kristan D. Davis; Marc Boris Dombrowa; Gerard V. Kopcsay; Robert M. Senger; Yutaka Sugawara; Krishnan Sugavanam (ITC, 2014)

Understanding Soft Error Resiliency of Blue Gene/Q Compute Chip through Hardware Proton Irradiation and Software Fault Injection. - Chen-Yong Cher; Meeta Sharma Gupta; Pradip Bose; K. Paul Muller (SC, 2014)

A case study of electromigration reliability: From design point to system operations. - Baozhen Li; K. Paul Muller; James D. Warnock; Leon J. Sigal; Dinesh Badami (IRPS, 2015)

Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology. - Pong-Fei Lu; Keith A. Jenkins; K. Paul Muller; Ralf Schaufler (IRPS, 2015)

SOI FinFET soft error upset susceptibility and analysis. - Phil Oldiges; Kenneth P. Rodbell; Michael S. Gordon; John G. Massey; Kevin Stawiasz; Conal E. Murray; Henry H. K. Tang; K. Kim; K. Paul Muller (IRPS, 2015)