A fine pitch probe technology for VLSI wafer testing. - T. Tada; R. Takagi; S. Nakao; M. Hyozo; T. Arakawa; K. Sawada; M. Ueda (ITC, 1990)

An Evaluation of IDDQ Versus Conventional Testing for CMOS Sea-of-Gate IC's. - K. Sawada; S. Kayano (ITC, 1992)

Smart microchips for intelligent sensing. - Makoto Ishida; Takeshi Kawano; K. Sawada (INSS, 2010)

Microscale temperature sensing using novel reliable silicon vertical microprobe array: Computation and experiment. - M. A. Matin; A. Ikedo; Takeshi Kawano; K. Sawada; Makoto Ishida (Microelectron. Reliab., 2015)