Network Resources Optimization for Random Linear Network Coding. - K. T. Kim; C.-S. Hwang (ICC, 2010)

Accelerated life test of high power white light emitting diodes based on package failure mechanisms. - Sung-Il Chan; W. S. Hong; K. T. Kim; Yang Gi Yoon; J. H. Han; Joong Soon Jang (Microelectron. Reliab., 2011)