A Physically Unclonable Function with 0% BER Using Soft Oxide Breakdown in 40nm CMOS. - Kai-Hsin Chuang; Erik Bury; Robin Degraeve; Ben Kaczer; Dimitri Linten; Ingrid Verbauwhede (A-SSCC, 2018)

Self-heating-aware CMOS reliability characterization using degradation maps. - Erik Bury; Adrian Vaisman Chasin; Ben Kaczer; Kai-Hsin Chuang; Jacopo Franco; Marko Simicic; Pieter Weckx; Dimitri Linten (IRPS, 2018)

A multi-bit/cell PUF using analog breakdown positions in CMOS. - Kai-Hsin Chuang; Erik Bury; Robin Degraeve; Ben Kaczer; T. Kallstenius; Guido Groeseneken; Dimitri Linten; Ingrid Verbauwhede (IRPS, 2018)

A Cautionary Note When Looking for a Truly Reconfigurable Resistive RAM PUF. - Kai-Hsin Chuang; Robin Degraeve; Andrea Fantini; Guido Groeseneken; Dimitri Linten; Ingrid Verbauwhede (IACR Trans. Cryptogr. Hardw. Embed. Syst., 2018)

A Physically Unclonable Function Using Soft Oxide Breakdown Featuring 0% Native BER and 51.8 fJ/bit in 40-nm CMOS. - Kai-Hsin Chuang; Erik Bury; Robin Degraeve; Ben Kaczer; Dimitri Linten; Ingrid Verbauwhede (IEEE J. Solid State Circuits, 2019)

The Influence of Gate Bias on the Anneal of Hot-Carrier Degradation. - Michiel Vandemaele; Kai-Hsin Chuang; Erik Bury; Stanislav Tyaginov; Guido Groeseneken; Ben Kaczer (IRPS, 2020)

New Adaptive Template Attacks Against Montgomery-Ladder-Based ECCs in IoT Devices. - Chun-Heng You; Chih-Hao Chiang; Paul C.-P. Chao 001; Wen-Ching Lin; Kai-Hsin Chuang (IEEE Internet Things J., 2024)