Towards Machine Learning Support for Embedded System Tests. - Stefan Scharoba; Kai-Uwe Basener; Jens Bielefeldt; Hans-Werner Wiesbrock; Michael Hübner 001 (DSD, 2021)

Einsatz von Deep Learning für den Test Eingebetteter Systeme. - Jens Bielefeldt; Kai-Uwe Basener; Siddique Reza Khan; Mozhdeh Massah; Hans-Werner Wiesbrock; Stefan Scharoba; Michael Hübner 001 (GI-Jahrestagung, 2021)

DeepTest: How Machine Learning Can Improve the Test of Embedded Systems. - Jens Bielefeldt; Kai-Uwe Basener; Siddique Reza Khan; Mozhdeh Massah; Hans-Werner Wiesbrock; Stefan Scharoba; Michael Hübner 001 (MECO, 2021)

DeepTest: Using Machine Learning for Generating new Testsequences. - Jens Bielefeldt; Kai-Uwe Basener; Roman Krajewski; Hans-Werner Wiesbrock; Marc Reichenbach; Michael Hübner 001 (MECO, 2024)