A Knowledge Push Method to Support the Debugging Process Design of Complex Electronic Products. - Hao Xue; Xingyu Chen; Tiannan Luo; Yang Li; Yuhan Liu; Kai Zhang 057 (EITCE, 2024)

Segmentation-assisted classification model with convolutional neural network for weld defect detection. - Yeqi Liu; Deping Yu; Wu Zhao; Kai Zhang 057 (Adv. Eng. Softw., 2024)