Testable Sequential Circuit Design: Partitioning for Pseudoexhaustive Test. - Bassam Shaer; Kailash Aurangabadkar; Nitin Agarwal (ISVLSI, 2003)

An Automated Algorithm for Partitioning Sequential VLSI Circuits. - Bassam Shaer; Kailash Aurangabadkar (ESA/VLSI, 2004)