Cross-Dimension Transfer Learning for Video-Based Facial Expression Recognition. - Kailun Zhong; Yi Li 006; Li Fang; Ping Chen (CCBR, 2019)

Short-Circuit Failure Mechanisms of 650-V GaN/SiC Cascode Devices in Comparison With SiC MOSFETs. - Jiahui Sun; Kailun Zhong; Zheyang Zheng; Gang Lyu; Kevin J. Chen (IEEE Trans. Ind. Electron., 2022)

IG- and VGS-Dependent Dynamic RON Characterization of Commercial High-Voltage p-GaN Gate Power HEMTs. - Kailun Zhong; Jin Wei; Jiabei He; Sirui Feng; Yuru Wang; Song Yang; Kevin J. Chen (IEEE Trans. Ind. Electron., 2022)

650-V Normally-OFF GaN/SiC Cascode Device for Power Switching Applications. - Kailun Zhong; Yuru Wang; Gang Lyu; Jin Wei; Jiahui Sun; Kevin J. Chen (IEEE Trans. Ind. Electron., 2022)

Dynamic Reverse Bias Reliability Testing of SiC MOSFETs. - Vamsi Mulpuri; Vishank Talesara; Kailun Zhong; Siddarth Sundaresan; Navitas Semiconductor (IRPS, 2025)