On the Diagnosis of System Faults with Propagation. - Kaiyuan Huang; Tinghuai Chen (IEEE Trans. Computers, 1986)

Diagnosability of system faults with propagation under asymmetric invalidation. - Kaiyuan Huang (Microprocess. Microprogramming, 1988)

Wafer Testing with Pairwise Comparisons. - Kaiyuan Huang; Vinod K. Agarwal; Laurence E. LaForge (FTCS, 1992)

Almost Sure Diagnosis of Almost Every Good Element. - Laurence E. LaForge; Kaiyuan Huang; Vinod K. Agarwal (IEEE Trans. Computers, 1994)

A Diagnosis Algorithm for Constant Degree Structures and Its Application to VLSI Circuit Testing. - Kaiyuan Huang; Vinod K. Agarwal; Laurence E. LaForge; Krishnaiyan Thulasiraman (IEEE Trans. Parallel Distributed Syst., 1995)

Diagnosis of clustered faults and wafer testing. - Kaiyuan Huang; Vinod K. Agarwal; Krishnaiyan Thulasiraman (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998)

Correct diagnosis of almost all faulty units in a multiprocessor system. - Krishnaiyan Thulasiraman; Anindya Das; Kaiyuan Huang; Vinod K. Agarwal (ISCAS (6), 1999)

Integrated Spatial Modulation and STBC-VBLAST Design toward Efficient MIMO Transmission. - Kaiyuan Huang; Yue Xiao; Lizhe Liu; Yong Li; Zhiqun Song; Bin Wang; Xingjian Li 001 (Sensors, 2022)

Sparse Space Shift Keying Modulation with Enhanced Constellation Mapping. - Tiebin Wang; Kaiyuan Huang; Min Liu; Ranran He (Sensors, 2022)

Design of OvTDM Toward Enhanced Physical Layer Security. - Chongda Huang; Kaiyuan Huang; Xiaoyuan Li; Yue Xiao (ISNCC, 2023)

UAV-Aided Dual-User Wireless Power Transfer: 3D Trajectory Design and Energy Optimization. - Xiaogang Gou; Zhaojie Sun; Kaiyuan Huang (Sensors, 2023)

Application of knowledge graph in software engineering field: A systematic literature review. - Lu Wang 014; Chenhan Sun; Chongyang Zhang; Weikun Nie; Kaiyuan Huang (Inf. Softw. Technol., 2023)

An Extended Model Predictive Control for PMSM With Minimum Ripples and Small Runtimes. - Kaiyuan Huang; Xiaogang Lin; Thomas Wu 001; Tao Luo; Wei Wang; Tianhao Liu; Dongdong Zhang (IEEE Trans. Ind. Electron., 2025)