A Design For Test Perspective on I/O Management. - Kamran Zarrineh; Vivek Chickermane; Gareth Nicholls; Mike Palmer (ICCD, 1996)

Addressing Early Design-For-Test Synthesis in a Production Environment. - Vivek Chickermane; Kamran Zarrineh (ITC, 1997)

A new framework for generating optimal March tests for memory arrays. - Kamran Zarrineh; Shambhu J. Upadhyaya; Sreejit Chakravarty (ITC, 1998)

Automatic Insertion of Scan Structures to Enhance Testability of Embedded Memories, Cores and Chips. - Kamran Zarrineh; Shambhu J. Upadhyaya; Philip Shephard III (VTS, 1998)

On Programmable Memory Built-In Self Test Architectures. - Kamran Zarrineh; Shambhu J. Upadhyaya (DATE, 1999)

Programmable Memory BIST and a New Synthesis Framework. - Kamran Zarrineh; Shambhu J. Upadhyaya (FTCS, 1999)

A design for test perspective on memory synthesis. - Kamran Zarrineh; Shambhu J. Upadhyaya (ISCAS (1), 1999)

A New Framework For Automatic Generation, Insertion and Verification of Memory Built-In Self Test Units. - Kamran Zarrineh; Shambhu J. Upadhyaya (VTS, 1999)

Self test architecture for testing complex memory structures. - Kamran Zarrineh; R. Dean Adams; Thomas J. Eckenrode; Steven P. Gregor (ITC, 2000)

Defect Analysis and Realistic Fault Model Extensions for Static Random Access Memories. - Kamran Zarrineh; R. Dean Adams; Aneesha P. Deo (MTDT, 2000)

Defect Analysis and a New Fault Model for Multi-port SRAMs. - Pradeep Nagaraj; Shambhu Upadhaya; Kamran Zarrineh; R. Dean Adams (DFT, 2001)

Automatic Generation and Validation of Memory Test Models for High Performance Microprocessors. - Kamran Zarrineh; Thomas A. Ziaja; Amitava Majumdar 002 (ICCD, 2001)

System-on-Chip Testability Using LSSD Scan Structures. - Kamran Zarrineh; Shambhu J. Upadhyaya; Vivek Chickermane (IEEE Des. Test Comput., 2001)

Automatic generation and compaction of March tests for memory arrays. - Kamran Zarrineh; Shambhu J. Upadhyaya; Sreejit Chakravarty (IEEE Trans. Very Large Scale Integr. Syst., 2001)

The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data. - Michael G. Wahl; Sudipta Bhawmik; Kamran Zarrineh; Pradipta Ghosh; Scott Davidson 001; Peter Harrod (ITC, 2003)

Design and analysis of multiple weight linear compactors of responses containing unknown values. - Thomas Clouqueur; Kamran Zarrineh; Kewal K. Saluja; Hideo Fujiwara (ITC, 2005)

Design for Test Challenges of High Performance/Low Power Microprocessors. - Kamran Zarrineh (DFT, 2008)

Feedback based droop mitigation. - Salvatore Pontarelli; Marco Ottavi; Adelio Salsano; Kamran Zarrineh (DATE, 2011)