An experimental 1.5-V 64-Mb DRAM. - Yoshinobu Nakagome; Hitoshi Tanaka; Kan Takeuchi; Eiji Kume; Yasushi Watanabe; Toru Kaga; Yoshifumi Kawamoto; Fumio Murai; Ryuichi Izawa; Digh Hisamoto; Teruaki Kisu; Takashi Nishida; et al. (IEEE J. Solid State Circuits, 1991)

Circuit techniques for 1.5-3.6-V battery-operated 64-Mb DRAM. - Yoshinobu Nakagome; Kiyoo Itoh 001; Kan Takeuchi; Eiji Kume; Hitoshi Tanaka; Masanori Isoda; Tatsunori Musha; Toru Kaga; Teruaki Kisu; Takashi Nishida; Yoshifumi Kawamoto; Masakazu Aoki (IEEE J. Solid State Circuits, 1991)

Sub-1-V swing internal bus architecture for future low-power ULSIs. - Yoshinobu Nakagome; Kiyoo Itoh 001; Masanori Isoda; Kan Takeuchi; Masakazu Aoki (IEEE J. Solid State Circuits, 1993)

Novel Tactile Sensors Manufactured by Carbon Microcoils. - Xiuqin Chen; Shaoming Yang; M. Hasegawa; Kan Takeuchi; K. Kawabe; Seiji Motojima (ICMENS, 2004)

Probabilistic crosstalk delay estimation for ASICs. - Kan Takeuchi; Kazumasa Yanagisawa; Takashi Sato 001; Kazuko Sakamoto; Saburo Hojo (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004)

Shake it up baby: scheduling with package auctions. - Kan Takeuchi; John Lin; Yan Chen 014; Thomas A. Finholt (EC, 2007)

A voltage drop aware crosstalk measurement with multi-aggressors in 65nm process. - Genichi Tanaka; Kan Takeuchi; Minoru Ito; Hiroaki Matsushita (CICC, 2008)

Observations of Supply-Voltage-Noise Dispersion in Sub-nsec. - Kan Takeuchi; Genichi Tanaka; Hiroaki Matsushita; Kenichi Yoshizumi; Yusaku Katsuki; Takao Sato (ITC, 2008)

Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations. - Kan Takeuchi; Atsushi Yoshikawa 003; Michio Komoda; Ken Kotani; Hiroaki Matsushita; Yusaku Katsuki; YuyoYamamoto; Takao Sato (IEEE Trans. Very Large Scale Integr. Syst., 2008)

Multi-object auctions with package bidding: An experimental comparison of Vickrey and iBEA. - Yan Chen 014; Kan Takeuchi (Games Econ. Behav., 2010)

Non-parametric test of time consistency: Present bias and future bias. - Kan Takeuchi (Games Econ. Behav., 2011)

28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization. - Mitsuhiko Igarashi; Kan Takeuchi; Yoshio Takazawa; Yasuto Igarashi; Hiroaki Matsushita (CICC, 2012)

Spatial Distribution Measurement of Dynamic Voltage Drop Caused by Pulse and Periodic Injection of Spot Noise. - Kan Takeuchi; Masaki Shimada; Takao Sato; Yusaku Katsuki; Hiroumi Yoshikawa; Hiroaki Matsushita (IEEE Trans. Very Large Scale Integr. Syst., 2013)

Assessment of reliability impact on GHz processors with moderate overdrive. - Mitsuhiko Igarashi; Hideki Aono; Hideaki Abe; Koji Shibutani; Kan Takeuchi (ISQED, 2014)

An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology. - Mitsuhiko Igarashi; Kan Takeuchi; Takeshi Okagaki; Koji Shibutani; Hiroaki Matsushita; Koji Nii (ESSCIRC, 2015)

FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs. - Kan Takeuchi; Masaki Shimada; Takeshi Okagaki; Koji Shibutani; Koji Nii; Fumio Tsuchiya (ESSCIRC, 2016)

NBTI/PBTI separated BTI monitor with 4.2x sensitivity by standard cell based unbalanced ring oscillator. - Mitsuhiko Igarashi; Yoshio Takazawa; Yasumasa Tsukamoto; Kan Takeuchi; Koji Shibutani (A-SSCC, 2017)

Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators. - Kan Takeuchi; Masaki Shimada; Takeshi Okagaki; Koji Shibutani; Koji Nii; Fumio Tsuchiya (IET Circuits Devices Syst., 2018)

Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance. - Kan Takeuchi; Masaki Shimada; Shinya Konishi; Daisuke Oshida; Naoya Ota; Takashi Yasumasu; Koji Shibutani; Tomohiro Iwashita; Tetsuya Kokubun; Fumio Tsuchiya (IRPS, 2019)