A library compatible driving point model for on-chip RLC interconnects. - Kanak Agarwal 001; Dennis Sylvester; David T. Blaauw (Timing Issues in the Specification and Synthesis of Digital Systems, 2002)

Efficient Generation of Delay Change Curves for Noise-Aware Static Timing Analysis. - Kanak Agarwal 001; Yu Cao 001; Takashi Sato 001; Dennis Sylvester; Chenming Hu (ASP-DAC/VLSI Design, 2002)

An effective capacitance based driver output model for on-chip RLC interconnects. - Kanak Agarwal 001; Dennis Sylvester; David T. Blaauw (DAC, 2003)

Simple metrics for slew rate of RC circuits based on two circuit moments. - Kanak Agarwal 001; Dennis Sylvester; David T. Blaauw (DAC, 2003)

Optimal Inductance for On-chip RLC Interconnections. - Shidhartha Das; Kanak Agarwal 001; David T. Blaauw; Dennis Sylvester (ICCD, 2003)

Dynamic clamping: on-chip dynamic shielding and termination for high-speed RLC buses. - Kanak Agarwal 001; Dennis Sylvester; David T. Blaauw (SoC, 2003)

Bidirectional closed-form transformation between on-chip coupling noise waveforms and interconnect delay-change curves. - Takashi Sato 001; Yu Cao 001; Kanak Agarwal 001; Dennis Sylvester; Chenming Hu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003)

A simplified transmission-line based crosstalk noise model for on-chip RLC wiring. - Kanak Agarwal 001; Dennis Sylvester; David T. Blaauw (ASP-DAC, 2004)

Variational delay metrics for interconnect timing analysis. - Kanak Agarwal 001; Dennis Sylvester; David T. Blaauw; Frank Liu 001; Sani R. Nassif; Sarma B. K. Vrudhula (DAC, 2004)

A New Threshold Voltage Assignment Scheme for Runtime Leakage Reduction in On-Chip Repeaters. - Saumil Shah; Kanak Agarwal 001; Dennis Sylvester (ICCD, 2004)

Approaches to run-time and standby mode leakage reduction in global buses. - Rahul M. Rao; Kanak Agarwal 001; Dennis Sylvester; Richard B. Brown; Kevin J. Nowka; Sani R. Nassif (ISLPED, 2004)

A library compatible driver output model for on-chip RLC transmission lines. - Kanak Agarwal 001; Dennis Sylvester; David T. Blaauw (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004)

A simple metric for slew rate of RC circuits based on two circuit moments. - Kanak Agarwal 001; Dennis Sylvester; David T. Blaauw (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004)

Statistical modeling of cross-coupling effects in VLSI interconnects. - Mridul Agarwal; Kanak Agarwal 001; Dennis Sylvester; David T. Blaauw (ASP-DAC, 2005)

Achieving continuous VT performance in a dual VT process. - Kanak Agarwal 001; Dennis Sylvester; David T. Blaauw; Anirudh Devgan (ASP-DAC, 2005)

Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance. - Ashish Srivastava; Saumil Shah; Kanak Agarwal 001; Dennis Sylvester; David T. Blaauw; Stephen W. Director (DAC, 2005)

Power-aware global signaling strategies. - Rahul M. Rao; Kanak Agarwal 001; Dennis Sylvester; Himanshu Kaul; Richard B. Brown; Sani R. Nassif (ISCAS (1), 2005)

Parametric Yield Analysis and Constrained-Based Supply Voltage Optimization. - Rahul M. Rao; Kanak Agarwal 001; Anirudh Devgan; Kevin J. Nowka; Dennis Sylvester; Richard B. Brown (ISQED, 2005)

Statistical analysis of SRAM cell stability. - Kanak Agarwal 001; Sani R. Nassif (DAC, 2006)

Characterization of total chip leakage using inverse (reciprocal) gamma distribution. - Emrah Acar; Kanak Agarwal 001; Sani R. Nassif (ISCAS, 2006)

Methods for estimating decoupling capacitance of nonswitching circuit blocks. - Sani R. Nassif; Kanak Agarwal 001; Emrah Acar (ISCAS, 2006)

Power Gating with Multiple Sleep Modes. - Kanak Agarwal 001; Kevin J. Nowka; Harmander Deogun; Dennis Sylvester (ISQED, 2006)

Statistical interconnect metrics for physical-design optimization. - Kanak Agarwal 001; Mridul Agarwal; Dennis Sylvester; David T. Blaauw (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006)

Modeling and analysis of crosstalk noise in coupled RLC interconnects. - Kanak Agarwal 001; Dennis Sylvester; David T. Blaauw (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006)

Characterizing Process Variation in Nanometer CMOS. - Kanak Agarwal 001; Sani R. Nassif (DAC, 2007)

Rigorous extraction of process variations for 65nm CMOS design. - Wei Zhao; Yu Cao 001; Frank Liu 001; Kanak Agarwal 001; Dhruva Acharyya; Sani R. Nassif; Kevin J. Nowka (ESSCIRC, 2007)

Efficient computation of current flow in signal wires for reliability analysis. - Kanak Agarwal 001; Frank Liu 001 (ICCAD, 2007)

Dynamic Power Management by Combination of Dual Static Supply Voltages. - Kanak Agarwal 001; Kevin J. Nowka (ISQED, 2007)

Parametric Yield Analysis and Optimization in Leakage Dominated Technologies. - Kanak Agarwal 001; Rahul M. Rao; Dennis Sylvester; Richard B. Brown (IEEE Trans. Very Large Scale Integr. Syst., 2007)

Enhanced Leakage Reduction Techniques Using Intermediate Strength Power Gating. - Harmander Singh; Kanak Agarwal 001; Dennis Sylvester; Kevin J. Nowka (IEEE Trans. Very Large Scale Integr. Syst., 2007)

Characterization and design for variability and reliability. - Kevin J. Nowka; Sani R. Nassif; Kanak Agarwal 001 (CICC, 2008)

Leakage power reduction using stress-enhanced layouts. - Vivek Joshi; Brian Cline; Dennis Sylvester; David T. Blaauw; Kanak Agarwal 001 (DAC, 2008)

Stress aware layout optimization. - Vivek Joshi; Brian Cline; Dennis Sylvester; David T. Blaauw; Kanak Agarwal 001 (ISPD, 2008)

A Design Model for Random Process Variability. - Victoria Wang; Kanak Agarwal 001; Sani R. Nassif; Kevin J. Nowka; Dejan Markovic (ISQED, 2008)

Variability in nanometer CMOS: Impact, analysis, and minimization. - Dennis Sylvester; Kanak Agarwal 001; Saumil Shah (Integr., 2008)

The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm CMOS Technologies. - Kanak Agarwal 001; Sani R. Nassif (IEEE Trans. Very Large Scale Integr. Syst., 2008)

Characterizing within-die variation from multiple supply port IDDQ measurements. - Kanak Agarwal 001; Dhruva Acharyya; Jim Plusquellic (ICCAD, 2009)

The impact of BEOL lithography effects on the SRAM cell performance and yield. - Nancy Ying Zhou; Rouwaida Kanj; Kanak Agarwal 001; Zhuo Li 001; Rajiv V. Joshi; Sani R. Nassif; Weiping Shi (ISQED, 2009)

Analyzing electrical effects of RTA-driven local anneal temperature variation. - Vivek Joshi; Kanak Agarwal 001; Dennis Sylvester; David T. Blaauw (ASP-DAC, 2010)

Ground rule slack aware tolerance-driven optical proximity correction for local metal interconnects. - Shayak Banerjee; Kanak B. Agarwal; Michael Orshansky (CICC, 2010)

Frequency domain decomposition of layouts for double dipole lithography. - Kanak Agarwal 001 (DAC, 2010)

Closed-form modeling of layout-dependent mechanical stress. - Vivek Joshi; Valeriy Sukharev; Andres Torres; Kanak Agarwal 001; Dennis Sylvester; David T. Blaauw (DAC, 2010)

A methodology for propagating design tolerances to shape tolerances for use in manufacturing. - Shayak Banerjee; Kanak B. Agarwal; Chin Ngai Sze; Sani R. Nassif; Michael Orshansky (DATE, 2010)

On-die sensors for measuring process and environmental variations in integrated circuits. - Kanak Agarwal 001 (ACM Great Lakes Symposium on VLSI, 2010)

SMATO: Simultaneous mask and target optimization for improving lithographic process window. - Shayak Banerjee; Kanak B. Agarwal; Michael Orshansky (ICCAD, 2010)

Analysis and optimization of SRAM robustness for double patterning lithography. - Vivek Joshi; Kanak Agarwal 001; David T. Blaauw; Dennis Sylvester (ICCAD, 2010)

Active learning framework for post-silicon variation extraction and test cost reduction. - Cheng Zhuo; Kanak Agarwal 001; David T. Blaauw; Dennis Sylvester (ICCAD, 2010)

Simultaneous extraction of effective gate length and low-field mobility in non-uniform devices. - Vivek Joshi; Kanak Agarwal 001; Dennis Sylvester (ISQED, 2010)

Leveraging existing power control circuits and power delivery architecture for variability measurement. - Dhruva Acharyya; Kanak Agarwal 001; Jim Plusquellic (ITC, 2010)

Mechanical Stress Aware Optimization for Leakage Power Reduction. - Vivek Joshi; Brian Cline; Dennis Sylvester; David T. Blaauw; Kanak Agarwal 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010)

Dynamically Pulsed MTCMOS With Bus Encoding for Reduction of Total Power and Crosstalk Noise. - Harmander Singh; Rahul M. Rao; Kanak Agarwal 001; Dennis Sylvester; Richard B. Brown (IEEE Trans. Very Large Scale Integr. Syst., 2010)

Electrically-driven retargeting for nanoscale layouts. - Shayak Banerjee; Kanak B. Agarwal; Sani R. Nassif (CICC, 2011)

Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect. - Jim Aarestad; Charles Lamech; Jim Plusquellic; Dhruva Acharyya; Kanak Agarwal 001 (DAC, 2011)

A framework for double patterning-enabled design. - Rani S. Ghaida; Kanak B. Agarwal; Sani R. Nassif; Xin Yuan; Lars Liebmann; Puneet Gupta 001 (ICCAD, 2011)

Accelerated statistical simulation via on-demand Hermite spline interpolations. - Rouwaida Kanj; Tong Li; Rajiv V. Joshi; Kanak Agarwal 001; Ali Sadigh; David Winston; Sani R. Nassif (ICCAD, 2011)

REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations. - Charles Lamech; Jim Aarestad; Jim Plusquellic; Reza M. Rad; Kanak Agarwal 001 (ICCAD, 2011)

Coupling timing objectives with optical proximity correction for improved timing yield. - Shayak Banerjee; Kanak B. Agarwal; Sani R. Nassif; James A. Culp; Lars Liebmann; Michael Orshansky (ISQED, 2011)

Measuring within-die spatial variation profile through power supply current measurements. - Jim Plusquellic; Dhruva Acharyya; Kanak Agarwal 001 (ISQED, 2011)

Design-patterning co-optimization of SRAM robustness for double patterning lithography. - Vivek Joshi; Kanak Agarwal 001; Dennis Sylvester (ASP-DAC, 2012)

Design driven patterning optimizations for low K1 lithography. - Kanak B. Agarwal; Shayak Banerjee (ICICDT, 2012)

O(n) layout-coloring for multiple-patterning lithography and conflict-removal using compaction. - Rani S. Ghaida; Kanak B. Agarwal; Sani R. Nassif; Xin Yuan; Lars W. Liebmann; Puneet Gupta 001 (ICICDT, 2012)

Design-aware lithography. - Shayak Banerjee; Kanak B. Agarwal; Sani R. Nassif (ISPD, 2012)

A high-speed and large-scale dictionary matching engine for Information Extraction systems. - Kanak Agarwal 001; Raphael Polig (ASAP, 2013)

Layout Decomposition and Legalization for Double-Patterning Technology. - Rani S. Ghaida; Kanak B. Agarwal; Sani R. Nassif; Xin Yuan; Lars Liebmann; Puneet Gupta 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013)

Wire-Speed Differential SOAP Encoding. - Kanak Agarwal 001 (ICWS, 2014)

Low-latency Network Monitoring via Oversubscribed Port Mirroring. - Jeff Rasley; Brent E. Stephens; Colin Dixon; Eric Rozner; Wes Felter; Kanak Agarwal 001; John B. Carter; Rodrigo Fonseca (ONS, 2014)

Shadow MACs: scalable label-switching for commodity ethernet. - Kanak Agarwal 001; Colin Dixon; Eric Rozner; John B. Carter (HotSDN, 2014)

SDN traceroute: tracing SDN forwarding without changing network behavior. - Kanak Agarwal 001; Eric Rozner; Colin Dixon; John B. Carter (HotSDN, 2014)

Planck: millisecond-scale monitoring and control for commodity networks. - Jeff Rasley; Brent E. Stephens; Colin Dixon; Eric Rozner; Wes Felter; Kanak Agarwal 001; John B. Carter; Rodrigo Fonseca (SIGCOMM, 2014)

TSV/FET proximity study using dense addressable transistor arrays. - Raphael Robertazzi; Kanak Agarwal 001; Bucknell Webb; Christy Tyberg (IRPS, 2015)

Presto: Edge-based Load Balancing for Fast Datacenter Networks. - Keqiang He; Eric Rozner; Kanak Agarwal 001; Wes Felter; John B. Carter; Aditya Akella (SIGCOMM, 2015)

AC/DC TCP: Virtual Congestion Control Enforcement for Datacenter Networks. - Keqiang He; Eric Rozner; Kanak Agarwal 001; Yu (Jason) Gu; Wes Felter; John B. Carter; Aditya Akella (SIGCOMM, 2016)

IBM Bluemix Mobile Cloud Services. - Ahmed Gheith; Ramakrishnan Rajamony; Patrick J. Bohrer; Kanak Agarwal 001; Michael Kistler; B. L. White Eagle; C. A. Hambridge; John B. Carter; T. Kaplinger (IBM J. Res. Dev., 2016)

SMARTER: Experiences with Cloud Native on the Edge. - Alexandre Ferreira; Eric Van Hensbergen; Chris Adeniyi-Jones; Edmund Grimley-Evans; Josh Minor; Mark Nutter; Luis E. Peña; Kanak Agarwal 001; Jon Hermes (HotEdge, 2020)