Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM. - Nam-Hyun Lee; Jongkyun Kim; Donghee Son; Kangjun Kim; Jung Eun Seok (IRPS, 2019)

Comparison of Performance of Predicting the Wear Amount of Tire Tread Depending on Sensing Information. - Kangjun Kim; Hyunjae Park; Taewung Kim (Sensors, 2023)